Application of atomic and molecular primary ions for TOF–SIMS analysis of additive containing polymer surfaces

This publication has 9 references indexed in Scilit:

• Secondary ion emission from polymethacrylate LB-layers under 0.5–11 keV atomic and molecular primary ion bombardment
  Applied Surface Science, 2000
• Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment
  Applied Surface Science, 1999
• Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardment
  Applied Surface Science, 1998
• Plastics Additives
  Published by Springer Nature ,1998
• Antioxidant interaction between organic phosphites and hindered amine light stabilizers: effects during photoxidation of polypropylene—II
  Polymer Degradation and Stability, 1997
• Evidence for strongly enhanced yields of negative molecular secondary ions due to bombardment with SFn cluster ions
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1994
• Handbook of static secondary ion mass spectrometry (SIMS) : Wiley, Chichester, 1989 (ISBN 0-471-91627-7). 156 pp. Price £ 125.00
  Analytica Chimica Acta, 1990
• Effects of primary ion polyatomicity and kinetic energy on secondary ion yield and internal energy in sims
  International Journal of Mass Spectrometry and Ion Processes, 1990
• Design and performance of a reflectron based time-of-flight secondary ion mass spectrometer with electrodynamic primary ion mass separation
  Journal of Vacuum Science & Technology A, 1987