Secondary ion emission from polymethacrylate LB-layers under 0.5–11 keV atomic and molecular primary ion bombardment

This publication has 9 references indexed in Scilit:

• Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment
  Applied Surface Science, 1999
• Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry
  Rapid Communications in Mass Spectrometry, 1998
• Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardment
  Applied Surface Science, 1998
• Molecular dynamics simulations to explore the effect of projectile size on the ejection of organic targets from metal surfaces
  International Journal of Mass Spectrometry and Ion Processes, 1998
• Static SIMS investigation of tetraethylammonium bromide on soil particles using ReO4− and Ga+ projectiles
  International Journal of Mass Spectrometry and Ion Processes, 1998
• Analysis of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry (TOF-SIMS)
  Journal of Physics D: Applied Physics, 1992
• Characterization of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry
  Thin Solid Films, 1992
• Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organics
  Analytical Chemistry, 1989
• Design and performance of a reflectron based time-of-flight secondary ion mass spectrometer with electrodynamic primary ion mass separation
  Journal of Vacuum Science & Technology A, 1987