Chemically-Sensitive Imaging in Tapping Mode by Chemical Force Microscopy: Relationship between Phase Lag and Adhesion
- 7 February 1998
- journal article
- research article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 14 (7) , 1508-1511
- https://doi.org/10.1021/la970948f
Abstract
No abstract availableKeywords
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