Substrate temperature dependence of the texture quality in YBCO thin films fabricated by on-axis pulsed-laser ablation

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Abstract
In applications of superconducting devices, the crystalline texture of high-quality thin films is of primary importance. The preferred orientation of the films can be essentially controlled by means of the substrate temperature, . In order to study the dependence of the film texture on different , a series of films were deposited on YSZ substrates by the on-axis pulsed-laser ablation technique. The substrate temperature was varied from to while the rest of the growth parameters remained the same. Various analytical techniques, including x-ray diffraction, scanning electron microscopy, micro-Raman spectroscopy and the four-point probe method, were applied to characterize the films. At around , the best films with the smoothest surface morphology, lowest FWHM of the rocking curve and highest in-plane texture were obtained. The resultant in excess of at 77 K and around 91 K were also achieved at this temperature.