Detection of ultrasound using a tunneling microscope
- 1 August 1992
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 72 (3) , 861-864
- https://doi.org/10.1063/1.351759
Abstract
We have developed a scanning tunneling microscope capable of detecting high frequency (1.8–12.5 MHz) acoustic waves. Acoustic pulses arriving at a conducting surface are detected as a high frequency perturbation of the tunneling current. Near and below the rolloff frequency of the current to voltage amplifier, the instantaneous displacement of the surface can be reconstructed. For higher frequencies, the nonlinear (rectifying) properties of the tunneling behavior allow the detection of the envelope (and hence the time of arrival and total amplitude) of the acoustic burst. The technique’s sensitivity is comparable to that of optical detection schemes but offers much better lateral resolution.This publication has 11 references indexed in Scilit:
- Detection of surface acoustic waves by scanning tunneling microscopyApplied Physics A, 1991
- Tip–sample interaction forces in scanning tunneling microscopy: Effects of contaminantsJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Simulations of STM Images and Work Function for Rough SurfacesJapanese Journal of Applied Physics, 1990
- Tunneling Acoustic MicroscopeJapanese Journal of Applied Physics, 1989
- Tunneling acoustic microscopeApplied Physics Letters, 1989
- An electron tunneling sensorSensors and Actuators, 1989
- A Possible Novel Scanning Ultrasonic Tip MicroscopeJapanese Journal of Applied Physics, 1989
- Scanning near-field acoustic microscopyApplied Physics B Laser and Optics, 1989
- Determination of displacements in ultrasonic waves by scanning tunneling microscopyJournal of Applied Physics, 1988
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982