A background correction for energy-dispersive X-ray analysis of thin sections
- 1 July 1977
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 6 (3) , 154-160
- https://doi.org/10.1002/xrs.1300060310
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- The atomic number dependence of the X-ray continuum intensity and the practical calculation of background in energy dispersive electron microprobe analysisX-Ray Spectrometry, 1975
- The shape of the continuous X‐ray spectrum and background corrections for energy‐dispersive electron microprobe analysisX-Ray Spectrometry, 1975
- Carbon support films for electron microscopy by deposition on an organic glassJournal of Physics E: Scientific Instruments, 1974
- Background corrections for quantitative electron microprobe analysis using a lithium drifted silicon X-ray detectorJournal of Physics E: Scientific Instruments, 1973
- Escape peaks and internal fluorescence in X-ray spectra recorded with lithium drifted silicon detectorsJournal of Physics E: Scientific Instruments, 1972
- Multiple scattering of 5 - 30 keV electrons in evaporated metal films III: Backscattering and absorptionBritish Journal of Applied Physics, 1965
- Multiple scattering of 5-30 keV electrons in evaporated metal films II: Range-energy relationsBritish Journal of Applied Physics, 1964
- XCIII. On the theory of X-ray absorption and of the continuous X-ray spectrumJournal of Computers in Education, 1923