An off-chip IDDq current measurement unit for telecommunication ASICs
- 17 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 203-212
- https://doi.org/10.1109/test.1994.527951
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Quiescent current estimation for current testingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Circuit design for built-in current testingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Can IDDQ test replace conventional stuck-fault test?Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002