Circuit design for built-in current testing
- 9 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Built-in current testing-feasibility studyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- CMOS bridging fault detectionPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A self-testing ALU using built-in current sensingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1989