A self-testing ALU using built-in current sensing
- 1 January 1989
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
A CMOS ALU (arithmetic logic unit) chip containing built-in current (BIC) sensors, which perform self-testing of the ALU, is described. The performance of two ALUs (one with and one without a BIC sensor) is analyzed by using externally applied test vectors and linear feedback shift register for BIC and for stuck-fault testing. The results demonstrate that the BIC testing methodology is well suited for initial die testing of CMOS ICs as well as for concurrent self-testing of highly reliable systemsKeywords
This publication has 6 references indexed in Scilit:
- Electrical properties and detection methods for CMOS IC defectsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Test generation for current testingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Current sensing for built-in testing of CMOS circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Built-in current testing-feasibility studyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Testing oriented analysis of CMOS ICs with opensPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- COSMOS: a compiled simulator for MOS circuitsPublished by Association for Computing Machinery (ACM) ,1987