Current sensing for built-in testing of CMOS circuits
- 6 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 454-457
- https://doi.org/10.1109/iccd.1988.25742
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- A circuit breaker for redundant IC systemsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Built-in current testing-feasibility studyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Test Considerations for Gate Oxide Shorts in CMOS ICsIEEE Design & Test of Computers, 1986
- Testing for Bridging Faults (Shorts) in CMOS CircuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983