Test generation for current testing
- 7 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 194-200
- https://doi.org/10.1109/etc.1989.36243
Abstract
Current testing has been found to be useful for testing CMOS ICs because it can detect a large class of manufacturing defects. The concept of current testing is described; the classes of defects detectable by current testing and the conditions to detect a given defect are described; and a general test-vector generation algorithm for current testing is developed and applied to two examples.Keywords
This publication has 11 references indexed in Scilit:
- Current sensing for built-in testing of CMOS circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Built-in current testing-feasibility studyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Testing oriented analysis of CMOS ICs with opensPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Boolean Analysis of MOS CircuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1987
- COSMOS: a compiled simulator for MOS circuitsPublished by Association for Computing Machinery (ACM) ,1987
- Designing CMOS Circuits for Switch-Level TestabilityIEEE Design & Test of Computers, 1987
- VLASIC: A Catastrophic Fault Yield Simulator for Integrated CircuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1986
- Test Considerations for Gate Oxide Shorts in CMOS ICsIEEE Design & Test of Computers, 1986
- Inductive Fault Analysis of MOS Integrated CircuitsIEEE Design & Test of Computers, 1985
- Testing for Bridging Faults (Shorts) in CMOS CircuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983