Si 2p core level spectroscopy in Si(001)2×1: the charge-transfer effect
- 27 November 1998
- journal article
- Published by Elsevier in Surface Science
- Vol. 418 (1) , 113-121
- https://doi.org/10.1016/s0039-6028(98)00706-7
Abstract
No abstract availableThis publication has 30 references indexed in Scilit:
- Surface Core-Level Photoelectron Diffraction from Si Dimers at the Si(001)-() SurfacePhysical Review Letters, 1995
- Correlation of surface core levels and structural building blocks for the Si(111)-7×7 reconstruction through high-resolution core-level spectroscopyPhysical Review B, 1994
- Surface core-level shifts of Si(111)7×7: A fundamental reassessmentPhysical Review B, 1994
- Carlisleet al. replyPhysical Review Letters, 1994
- Extended photoemission fine structure analysis of the Si(111)-(7×7) surface core levelsPhysical Review Letters, 1993
- Abinitiosurface core-level shifts and surface segregation energiesPhysical Review Letters, 1993
- Evidence for site-sensitive screening of core holes at the Si and Ge (001) surfacePhysical Review Letters, 1993
- Core-level spectroscopy of the clean Si(001) surface: Charge transfer within asymmetric dimers of the 2×1 andc(4×2) reconstructionsPhysical Review Letters, 1992
- Inverse photoemission from semiconductorsSurface Science Reports, 1990
- Origin of surface states on Si(111)(7×7)Physical Review Letters, 1986