A self-test approach using accumulators as test pattern generators
- 19 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 3, 2120-2123
- https://doi.org/10.1109/iscas.1995.523844
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Test responses compaction in accumulators with rotate carry addersIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1993
- A data path synthesis method for self-testable designsPublished by Association for Computing Machinery (ACM) ,1991
- Cellular automata-based pseudorandom number generators for built-in self-testIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1989
- A Knowledge-Based System for Designing Testable VLSI ChipsIEEE Design & Test of Computers, 1985