Test responses compaction in accumulators with rotate carry adders
- 1 April 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 12 (4) , 531-539
- https://doi.org/10.1109/43.229736
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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