Breakdown voltage analysis of planar p-n junctions taking into account the radius of curvature of the corners in the patterning mask
- 31 December 1985
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 28 (12) , 1245-1249
- https://doi.org/10.1016/0038-1101(85)90049-8
Abstract
No abstract availableKeywords
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