Force measurement with a piezoelectric cantilever in a scanning force microscope
- 31 July 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 42-44, 1464-1469
- https://doi.org/10.1016/0304-3991(92)90467-x
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Compact scanning-force microscope using a laser diodeOptics Letters, 1988
- Force microscope using a fiber-optic displacement sensorReview of Scientific Instruments, 1988
- Novel optical approach to atomic force microscopyApplied Physics Letters, 1988
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986