Trends and challenges in VLSI circuit reliability
Top Cited Papers
- 4 September 2003
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Micro
- Vol. 23 (4) , 14-19
- https://doi.org/10.1109/mm.2003.1225959
Abstract
Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them.Keywords
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