Comparative study of the GaAs (113), (115), (001), (115) , (113) , and (110) surfaces by atomic force microscopy, low energy electron diffraction, and reflectance anisotropy spectroscopy
- 5 April 1999
- journal article
- Published by Elsevier in Microelectronics Journal
- Vol. 30 (4-5) , 449-453
- https://doi.org/10.1016/s0026-2692(98)00151-7
Abstract
No abstract availableKeywords
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