New model of the irradiation-induced 0.97-eV () line in silicon: Acomplex
- 15 November 1981
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 24 (10) , 5874-5886
- https://doi.org/10.1103/physrevb.24.5874
Abstract
We report on a high-resolution photoluminescence and absorption study with the application of external stress and magnetic fields on the 0.97-eV () line. We determine the symmetry of the related center to be monoclinic . It is shown that satellite lines , , and , which are observed in luminescence or absorption, are local modes of the -line center. The low-energy local modes and both exhibit isotope effects upon implantation of the Si samples. The doublet structure due to and gives evidence that one substitutional carbon atom is incorporated in the complex. We observe a nonthermalizing and stress-independent triplet structure of the line in luminescence as well as in absorption with intensities almost identical to the natural abundances of , , and . This establishes our basic model of substitutional carbon atom interacting with a single silicon atom, , in a prominent position. Relaxation of the complex leads to a symmetry lowering from a trigonal defect configuration to a monoclinic symmetry with a (110) mirror plane. Two particular models are discussed in detail, one being a dumbbell having relaxed off a bond-centered position, the other being a carbon-vacancy complex similar to the electron-paramagnetic-resonance center.
Keywords
This publication has 29 references indexed in Scilit:
- Photoluminescence from carbon and oxygen implanted SiRadiation Effects, 1977
- Photoluminescence from Si irradiated with 1.5-MeV electrons at 100 °KJournal of Applied Physics, 1976
- Aluminum and gallium impurity effects on the photoluminescence from electron irradiated, pulled siliconSolid State Communications, 1974
- EPR of a Jahn-Teller distorted (111) carbon interstitialcy in irradiated siliconPhysical Review B, 1974
- Recombination luminescence from electron-irradiated Li-diffused SiJournal of Applied Physics, 1973
- Temperature, stress, and annealing effects on the luminescence from electron-irradiated siliconJournal of Applied Physics, 1973
- Recombination luminescence in irradiated silicon-effects of uniaxial stress and temperature variations†Radiation Effects, 1971
- Irradiation damage in carbon-doped silicon irradiated at low temperatures by 2 MeV electronsRadiation Effects, 1971
- Electron irradiation damage in silicon containing carbon and oxygenJournal of Physics and Chemistry of Solids, 1970
- Recombination Luminescence in Irradiated SiliconPhysical Review B, 1968