Piezoelectric displacement sensing with a single-electron transistor
- 16 September 2002
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 81 (12) , 2258-2260
- https://doi.org/10.1063/1.1507616
Abstract
We propose a displacement sensing scheme for rf mechanical resonators made from GaAs, based on detecting the piezoelectrically induced charge. By using a single-electron transistor to detect the charge, we calculate that a significantly higher displacement sensitivity can be achieved than by using capacitive displacement sensing, primarily due to the strong piezoelectric coupling strength. We estimate a displacement sensitivity of order for a 1 GHz GaAs resonator. Our model solves the coupled electromechanical response self-consistently, including the effects of both dissipative and reactive electronic circuit elements on the resonator behavior.
Keywords
This publication has 12 references indexed in Scilit:
- Single-electron transistor as a radio-frequency mixerApplied Physics Letters, 2002
- Scanned Probe Imaging of Single-Electron Charge States in Nanotube Quantum DotsScience, 2002
- Intrinsic noise of a micromechanical displacement detector based on the radio-frequency single-electron transistorJournal of Applied Physics, 2002
- Entanglement and Decoherence of a Micromechanical Resonator via Coupling to a Cooper-Pair BoxPhysical Review Letters, 2002
- Single-crystal aluminum nitride nanomechanical resonatorsApplied Physics Letters, 2001
- Sensitivity of a micromechanical displacement detector based on the radio-frequency single-electron transistorApplied Physics Letters, 2000
- GaAs/AlGaAs self-sensing cantilevers for low temperature scanning probe microscopyApplied Physics Letters, 1998
- Intrinsic noise of the single-electron transistorPhysical Review B, 1994
- The piezoelectric effect of GaAs used for resonators and resonant sensorsJournal of Micromechanics and Microengineering, 1994
- GaAs, AlAs, and AlxGa1−xAs: Material parameters for use in research and device applicationsJournal of Applied Physics, 1985