Photoreflectance measurement of strain in epitaxial GaAs on silicon
- 1 May 1990
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 67 (9) , 4389-4392
- https://doi.org/10.1063/1.344913
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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