Mechanisms for total dose sensitivity to preirradiation thermal stress in bipolar linear microcircuits
- 1 June 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 45 (3) , 1425-1430
- https://doi.org/10.1109/23.685218
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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