A compendium of recent total dose data on bipolar linear microcircuits

This publication has 10 references indexed in Scilit:

• Total-dose and SEU results for the AD8001, a high-performance commercial op-amp fabricated in a dielectrically-isolated, complementary-bipolar process
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Total dose effects on elementary transistors of a comparator in bipolar technology
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Analysis of bipolar linear circuit response mechanisms for high and low dose rate total dose irradiations
  IEEE Transactions on Nuclear Science, 1996
• Enhanced damage in linear bipolar integrated circuits at low dose rate
  IEEE Transactions on Nuclear Science, 1995
• Hardness-assurance issues for lateral PNP bipolar junction transistors
  IEEE Transactions on Nuclear Science, 1995
• Dose rate and annealing effects on total dose response of MOS and bipolar circuits
  IEEE Transactions on Nuclear Science, 1995
• Total dose effects on negative voltage regulator
  IEEE Transactions on Nuclear Science, 1994
• Total dose effects in conventional bipolar transistors and linear integrated circuits
  IEEE Transactions on Nuclear Science, 1994
• Dependence of total dose response of bipolar linear microcircuits on applied dose rate
  IEEE Transactions on Nuclear Science, 1994
• Response of advanced bipolar processes to ionizing radiation
  IEEE Transactions on Nuclear Science, 1991