Enabling in situ atomic-scale characterization of epitaxial surfaces and interfaces
- 1 November 1998
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 16 (6) , 3112-3114
- https://doi.org/10.1116/1.590496
Abstract
A custom designed sample handling system which allows the integration of a commercially available scanning tunneling microscope (STM) facility with a commercially available molecular beam epitaxy (MBE) facility is described. No customization of either the STM imaging stage or the MBE is required to implement this design.This publication has 4 references indexed in Scilit:
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