Enhanced through-reflect-line characterization of two-port measuring systems using free-space capacitance calculation
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 38 (2) , 215-217
- https://doi.org/10.1109/22.46433
Abstract
No abstract availableKeywords
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