Optical Studies of Microstructure in a-Si:H
- 1 January 1990
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Structural and chemical characterizationPublished by Springer Nature ,2005
- Characterization of microvoids in device-quality hydrogenated amorphous silicon by small-angle x-ray scattering and infrared measurementsPhysical Review B, 1989
- Light scattering effects in CPM and PDS measurement on a-Si:H filmsJournal of Non-Crystalline Solids, 1989
- “Structural Heterogeneities in Device-Quality Amorphous Hydrogenated Semiconductors”Published by World Scientific Pub Co Pte Ltd ,1989
- VHF-GD a-Si:H Films Prepared at Very Low TemperatureMRS Proceedings, 1989
- Influence of plasma excitation frequency fora-Si:H thin film depositionPlasma Chemistry and Plasma Processing, 1987
- Density of the gap states in undoped and doped glow discharge a-Si:HSolar Energy Materials, 1983
- The effects of sample imperfections on optical spectraPhysica Status Solidi (b), 1972