On the behaviour of currents going through MOS structures under ionizing radiations
- 31 March 1971
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 14 (3) , 257-260
- https://doi.org/10.1016/0038-1101(71)90040-2
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Degradation mechanism of m.o.s. structures and transistors under ionising radiationElectronics Letters, 1970
- Effects of ionizing radiation on MOS devicesSolid-State Electronics, 1969