Effects of ionizing radiation on MOS devices

This publication has 12 references indexed in Scilit:

• Radiation-induced space-charge buildup in MOS structures
  IEEE Transactions on Electron Devices, 1967
• Surface Effects of Radiation on Semiconductor Devices*
  Bell System Technical Journal, 1967
• The Effects of Co60 Gamma Radiation on MOS Diodes
  IEEE Transactions on Nuclear Science, 1967
• Irradiation of MIS Capacitors with High Energy Electrons
  IEEE Transactions on Nuclear Science, 1966
• Planar-transistor stability under X ray irradiation
  Electronics Letters, 1966
• Behaviour of m.o.s. structures under X ray irradiation
  Electronics Letters, 1966
• Irradiation and annealing of silicon planar transistors
  Solid-State Electronics, 1966
• A micron bit-size charge-storage device
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1966
• Photoemission of Electrons from Silicon into Silicon Dioxide
  Physical Review B, 1965
• EFFECTS OF LOW-ENERGY ELECTRON IRRADIATION ON Si-INSULATED GATE FETs
  Applied Physics Letters, 1965