Characterization of proton interactions in electronic components
- 1 June 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 41 (3) , 593-600
- https://doi.org/10.1109/23.299805
Abstract
The responses of several np and pn diodes to 30, 100, 200 MeV protons were experimentally characterized. The results are compared with calculations using the HETC code. Well matching proton-induced SEU cross-sections are deduced.Keywords
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