Effect of surface roughness of carbon support films on high-resolution electron diffraction of two-dimensional protein crystals
- 30 September 1991
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 36 (4) , 307-318
- https://doi.org/10.1016/0304-3991(91)90123-n
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
- High-resolution electron crystallography of light-harvesting chlorophyll ab-protein complex in three different mediaJournal of Molecular Biology, 1991
- Model for the structure of bacteriorhodopsin based on high-resolution electron cryo-microscopyJournal of Molecular Biology, 1990
- Scanned-Probe MicroscopesScientific American, 1989
- Imaging Crystals, Polymers, and Processes in Water with the Atomic Force MicroscopeScience, 1989
- An atomic-resolution atomic-force microscope implemented using an optical leverJournal of Applied Physics, 1989
- Erratum: Novel optical approach to atomic force microscopy [Appl. Phys. Lett. 5 3, 1045 (1988)]Applied Physics Letters, 1988
- Atomic Force MicroscopePhysical Review Letters, 1986
- Measurement and evaluation of electron diffraction patterns from two-dimensional crystalsUltramicroscopy, 1984
- The structure of the purple membrane from Halobacterium halobium: Analysis of the X-ray diffraction patternJournal of Molecular Biology, 1975
- Opportunities for Collaboration in EuropeNature, 1971