A proposal concerning the nature of interface states in Si/SiO2
- 1 April 1970
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 20 (2) , 434-436
- https://doi.org/10.1016/0039-6028(70)90196-2
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- New Model for Interface Charge-Carrier Mobility: The Role of Misfit DislocationsPhysical Review Letters, 1968
- SURFACE STATES IN SILICON FROM CHARGES IN THE OXIDE COATINGApplied Physics Letters, 1968
- The Si-SiO2Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance TechniqueBell System Technical Journal, 1967
- Cascade Capture of Electrons in SolidsPhysical Review B, 1960
- Thermal capture of electrons in siliconAnnals of Physics, 1957