Growth of GaN on GaAs(111)B by Metalorganic Hydrogen Chloride VPE Using Double Buffer Layer

Abstract
GaN epitaxial layers were grown by metalorganic hydrogen chloride vapor phase epitaxy (MOH-VPE) using double GaN buffer layers on GaAs substrate. In this method, the first GaN buffer layer was deposited on GaAs(111)B substrate at 550° C, and after annealing at 850° C for 10 min, the second buffer layer was deposited at 500° C. Then the GaN epitaxial layer was grown at 850° C. The X-ray full width at half maximum (FWHM) value of the obtained hexagonal GaN was smaller than that of a GaN epitaxial layer with a single buffer layer. The room temperature photoluminescence spectra exhibited a strong peak at approximately 361.5 nm.

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