SIMS depth profile analysis using MCs+ molecular ions
- 1 January 1991
- journal article
- Published by Springer Nature in Analytical and Bioanalytical Chemistry
- Vol. 341 (1) , 54-56
- https://doi.org/10.1007/bf00322106
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Evaluation of a cesium positive ion source for secondary ion mass spectrometryAnalytical Chemistry, 1977
- Mass spectrometry of neutral molecules sputtered from polycrystalline metals by Ar+-ions of 100?1000 eVZeitschrift für Physik B Condensed Matter, 1975