A BIST scheme for an SNR test of a sigma-delta ADC
Top Cited Papers
- 30 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 805-814
- https://doi.org/10.1109/test.1993.470621
Abstract
Built-In-Self- Test (BIST) for VLSI systems is desirable in order to reduce the cost per chap of production-time testing by the manufacturer. In addi- tion, it can provide the means to perform in-the-field diagnostics. This paper discusses a Mixed Analog- Digital BIST (MADBIST) for a Signal-to-Noise-Ratio test of an Analog-to-Digital Converter. The MAD- BIST stmtegy for the SNR test of the A/D Converter is introduced, accuracy issues are discussed, and ex- perimental results are presented.Keywords
This publication has 5 references indexed in Scilit:
- A high-quality analog oscillator using oversampling D/A conversion techniquesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Towards built-in-self-test for SNR testing of a mixed-signal ICPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A comprehensive approach for modeling and testing analog and mixed-signal devicesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Filter banks for time-recursive implementation of transformsIEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 1993
- Full-speed testing of A/D convertersIEEE Journal of Solid-State Circuits, 1984