Electron and X-ray diffraction investigations of thin chromium films
- 20 March 1991
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 198 (1-2) , 241-250
- https://doi.org/10.1016/0040-6090(91)90343-v
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- Modulation and crystallographic orientation of sputtered CoNi/Cr disks for longitudinal recordingIEEE Transactions on Magnetics, 1987
- Effects of argon pressure and substrate heating on the chromium underlayer used for high-density longitudinal CoNiCr mediaJournal of Vacuum Science & Technology A, 1987
- New longitudinal recording media CoxNiyCrzfrom high rate static magnetron sputtering systemIEEE Transactions on Magnetics, 1986
- Film structure and magnetic properties of CoNiCr/Cr sputtered thin filmIEEE Transactions on Magnetics, 1986
- On the intrinsic stress in thin chromium filmsThin Solid Films, 1986
- Effect of residual gas pressure on the epitaxial growth of vacuum-deposited chromium on Cu{111} substratesThin Solid Films, 1986
- Dependence of structural and compositional characteristics of chromium metal films as a function of deposition rate during the fabrication of metal/insulator/semiconductor solar cellsThin Solid Films, 1985
- Formation conditions and structure of thin chromium films prepared by low temperature vapour depositionThin Solid Films, 1982
- Development of r.f. sputtered chromium oxide coating for wear applicationThin Solid Films, 1979
- Experimental studies using in-contact recording on chromium-cobalt filmsIEEE Transactions on Magnetics, 1969