AES, XPS and SIMS characterization of YBa2Cu3O7 superconducting high Tc thin films

This publication has 8 references indexed in Scilit:

• In-situ superconducting YBa2Cu3O7 thin films grown by ion beam co-deposition
  Applied Surface Science, 1989
• The preparation of YBCO thin films by a four ion beam co-deposition system
  Journal of the Less Common Metals, 1989
• Transfer and treatment of AES, XPS and SIMS data with a network computer station
  Surface and Interface Analysis, 1988
• Ion beam sputtering and properties of YBaCuO superconducting thin films
  Physica C: Superconductivity and its Applications, 1988
• Simultaneous AES and SIMS depth profiling of standard Ta₂O₅ films
  Surface and Interface Analysis, 1988
• The ultra-high resolution depth profiling reference material — Ta2O5 anodically grown on Ta
  Surface Science, 1984
• The depth dependence of the depth resolution in composition–depth profiling with Auger Electron Spectroscopy
  Surface and Interface Analysis, 1983
• High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of Gold
  Physical Review B, 1972