Models for quantitative charge imaging by atomic force microscopy
- 27 August 2001
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 90 (6) , 2764-2772
- https://doi.org/10.1063/1.1394896
Abstract
Two models are presented for quantitative charge imaging with an atomic-force microscope. The first is appropriate for noncontact mode and the second for intermittent contact (tapping) mode imaging. Different forms for the contact force are used to demonstrate that quantitative charge imaging is possible without precise knowledge of the contact interaction. From the models, estimates of the best charge sensitivity of an unbiased standard atomic-force microscope cantilever are found to be on the order of a few electrons.This publication has 50 references indexed in Scilit:
- Charging of single Si nanocrystals by atomic force microscopyApplied Physics Letters, 2001
- Charge storage in CeO2/Si/CeO2/Si(111) structures by electrostatic force microscopyApplied Physics Letters, 1999
- Charge storage in Co nanoclusters embedded in SiO2 by scanning force microscopyApplied Physics Letters, 1999
- Charge injection and extraction on organic dot structures by atomic force microscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1996
- Reproducible and Controllable Contact Electrification on a Thin InsulatorJapanese Journal of Applied Physics, 1993
- Observation of single charge carriers by force microscopyPhysical Review Letters, 1990
- Contact electrification using force microscopyPhysical Review Letters, 1989
- Deposition and imaging of localized charge on insulator surfaces using a force microscopeApplied Physics Letters, 1988
- High-resolution capacitance measurement and potentiometry by force microscopyApplied Physics Letters, 1988
- Atomic Force MicroscopePhysical Review Letters, 1986