FOCUS: an experimental environment for fault sensitivity analysis
- 1 January 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 41 (12) , 1515-1526
- https://doi.org/10.1109/12.214660
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
- TRANSIENT UPSETS IN MICROPROCESSOR CONTROLLERSPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Evaluation of error detection schemes using fault injection by heavy-ion radiationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Measurement-Based Analysis of Error LatencyIEEE Transactions on Computers, 1987
- A Measurement-Based Model for Workload Dependence of CPU ErrorsIEEE Transactions on Computers, 1986
- Techniques of Microprocessor Testing and SEU-Rate PredictionIEEE Transactions on Nuclear Science, 1985
- SEU Vulnerability of the Zilog Z-80 and NSC-800 MicroprocessorsIEEE Transactions on Nuclear Science, 1985
- Simulation Approach for Modeling Single Event Upsets on Advanced CMOS SRAMSIEEE Transactions on Nuclear Science, 1985
- A Comparison of Heavy Ion Sources Used in Cosmic Ray Simulation Studies of VLSI CircuitsIEEE Transactions on Nuclear Science, 1984
- Circuit simulations of alpha-particle-induced soft errors in MOS dynamic RAMsIEEE Journal of Solid-State Circuits, 1981
- Alpha-particle-induced soft errors in dynamic memoriesIEEE Transactions on Electron Devices, 1979