Scanning tunneling microscope with three-dimensional interferometer for surface roughness measurement

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Abstract
The scanning tunneling microscope(STM) has been known for its high lateral resolution, but its unreliable vertical accuracy has prevented it from being widely used as a profiler for roughness and step height measurements. An STM equipped with an optical interferometer to calibrate STM tip feedback controlled motion in the Z direction along with interferometers for monitoring X and Y raster scanning has been developed. The resolution of the interferometer was 0.12 nm rms. Maximum line scanning distance is 250 μm and the motion in this direction is secured by a parallel spring mechanism. Step height and pitch measurements on a surface topography standard agree in nanometer scale with the certified value of the standard. The result of high accuracy roughnessmeasurement with the STM supports the common observation that STMmeasurement gives larger roughness than interferometric measurement.