Time-Resolved X-Ray Detection Using MOS-C Detectors
- 1 June 1972
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 19 (3) , 339-345
- https://doi.org/10.1109/tns.1972.4326747
Abstract
To develop a fast x-ray detector with a memory, we have performed experiments with metal-oxide-semiconductor capacitor (MOS-C) devices. For timeresolved recording of the x-ray pulse, a linear array of detectors is uniformly irradiated while the elements are sequentially biased at Δt time intervals; significant positive charge trapping occurs in each element of the array only during the period Δt when the high field bias is applied across the dielectric. Detection of 10-ns resolution has been recorded. Time-resolution is presently limited by the bandwidth limitation of the bias strobing method.Keywords
This publication has 4 references indexed in Scilit:
- Effects of ionizing radiation on oxidized silicon surfaces and planar devicesProceedings of the IEEE, 1967
- Photoemission of Holes from Silicon into Silicon DioxidePhysical Review B, 1966
- Photoemission of Electrons from Silicon and Gold into Silicon DioxidePhysical Review B, 1966
- Photoemission of Electrons from Silicon into Silicon DioxidePhysical Review B, 1965