Built-in self-test (BIST) structures for analog circuit fault diagnosis with current test data
- 1 January 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 41 (4) , 535-539
- https://doi.org/10.1109/19.155921
Abstract
No abstract availableKeywords
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