Quadrupoles for secondary ion mass spectrometry

This publication has 10 references indexed in Scilit:

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  International Journal of Mass Spectrometry and Ion Physics, 1975
• A detailed study of the quadrupole mass filter
  International Journal of Mass Spectrometry and Ion Physics, 1974
• Measurements of relative secondary ion yields from oxidized tungsten (100) under bombardment by ions with different masses and energies
  International Journal of Mass Spectrometry and Ion Physics, 1974
• Investigation of surface reactions by the static method of secondary ion mass spectrometry: II. The oxidation of chromium in the monolayer range
  Surface Science, 1973
• Velocity Filtering for Secondary Ion Quadrupole Mass Spectrometer
  Review of Scientific Instruments, 1973
• A Simple, Inexpensive SIMS Apparatus
  Review of Scientific Instruments, 1973
• A low background secondary ion mass spectrometer with quadrupole analyser
  International Journal of Mass Spectrometry and Ion Physics, 1973
• Determination of implantation profiles in solids by secondary ion mass spectrometry
  Physics Letters A, 1972
• Beobachtung von oberflächenreaktionen mit der statischen methode der sekundärionen-massenspektroskopie. I die methode
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• Das elektrische Massenfilter als Massenspektrometer und Isotopentrenner
  Zeitschrift für Physik, 1958