An XPS and WF study of the Er/Si(100) interface formation
- 1 July 1995
- journal article
- Published by Elsevier in Surface Science
- Vol. 331-333, 580-584
- https://doi.org/10.1016/0039-6028(95)00321-5
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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