High resolution X-ray spectroscopy using synchrotron radiation: Source characteristics and optical systems
- 1 January 1977
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 11 (1) , 13-38
- https://doi.org/10.1016/0368-2048(77)85046-9
Abstract
No abstract availableKeywords
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