Impurity effect in stacking fault energy of silicon crystals studied by high resolution electron microscopy

This publication has 29 references indexed in Scilit:

• Faulted dipoles in germanium A high-resolution transmission electron microscopy study
  Philosophical Magazine A, 1980
• Direct TEM determination of intrinsic and extrinsic stacking fault energies of silicon
  Philosophical Magazine A, 1979
• {113} Loops in electron-irradiated silicon
  Philosophical Magazine A, 1979
• Lattice imaging of faulted dipoles in silicon
  Philosophical Magazine A, 1979
• Weak-beam electron microscopy of faulted dipoles in deformed silicon
  Philosophical Magazine A, 1978
• On the nature of extended dislocations in deformed cadmium telluride
  Philosophical Magazine A, 1978
• Dissociation of near-screw dislocations in germanium and silicon
  Philosophical Magazine, 1975
• Extended dislocations in germanium
  Philosophical Magazine, 1973
• The dissociation of dislocations in silicon
  Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1971
• The observation of dissociated dislocations in silicon
  Philosophical Magazine, 1970