Metal diffusion from electrodes in organic light-emitting diodes
- 6 September 1999
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 75 (10) , 1404-1406
- https://doi.org/10.1063/1.124708
Abstract
Metal diffusion from magnesium–silver cathodes and indium–tin–oxide anodes in organic light-emitting diodes has been investigated. Magnesium showed no substantial diffusion under device operation and had no significant effects on luminance decay with operation time. Indium was immobile in storage at room temperature, while indium penetration into organic layers was observed after device operation. The presence of indium in organic films showed a correlation with performance degradation.Keywords
This publication has 10 references indexed in Scilit:
- Organic electroluminescent devices by high-temperature processing and crystalline hole transporting layerApplied Physics Letters, 1999
- Suppression of penetration of aluminum into 8-hydroxyquinoline aluminum via a thin oxide barrierApplied Physics Letters, 1998
- Lithium–aluminum contacts for organic light-emitting devicesApplied Physics Letters, 1997
- Diffusion of metals into organic filmsApplied Physics Letters, 1997
- Surface modification of indium tin oxide by plasma treatment: An effective method to improve the efficiency, brightness, and reliability of organic light emitting devicesApplied Physics Letters, 1997
- Electromigration of aluminum cathodes in polymer-based electroluminescent devicesApplied Physics Letters, 1996
- Indium contamination from the indium–tin–oxide electrode in polymer light-emitting diodesApplied Physics Letters, 1996
- Growth of dark spots by interdiffusion across organic layers in organic electroluminescent devicesApplied Physics Letters, 1996
- Chemistry, diffusion, and electronic properties of a metal/organic semiconductor contact: In/perylenetetracarboxylic dianhydrideApplied Physics Letters, 1996
- Organic electroluminescent diodesApplied Physics Letters, 1987