Digital image processing of multiple detector signals in scanning electron microscopy
- 31 December 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 16 (2) , 161-173
- https://doi.org/10.1016/0304-3991(85)90071-3
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Testing of detector strategies in scanning electron microscopy by isodensitiesJournal of Microscopy, 1984
- Backscattering coefficient of multicomponent specimensScanning, 1984
- Detector strategy for improvement of image contrast analogous to light illuminationScanning, 1984
- Secondary electron detection systems for quantitative voltage measurementsScanning, 1983
- The measurement of atomic number and composition in an SEM using backscattered detectorsJournal of Microscopy, 1981
- On‐line computation of diffractograms for the analysis of SEM imagesScanning, 1980
- Electron–channelling imaging in scanning electron microscopyPhilosophical Magazine A, 1979
- An automatic topographical surface reconstruction in the SEMScanning, 1979
- Low-Loss Image for Surface Scanning Electron MicroscopeApplied Physics Letters, 1971
- Electron Probe MicroanalysisPublished by Elsevier ,1960