Comparison of the Sensitivity to Heavy Ions of Sram in Different Simox Technologies
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
First Page of the Article Author(s) Ferlet-Cavrois, V. Commissariat a l''Energie Atomique, France Musseau, O. ; Leray, J.L. ; Coic, Y.M. ; Lecarval, G. ; Guichard, E.Keywords
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