Optical charge modulation as an internal voltage probe for CMOS ICs
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 24 (10) , 1981-1984
- https://doi.org/10.1109/3.8531
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Optical detection of charge modulation in silicon integrated circuits using a multimode laser-diode probeIEEE Electron Device Letters, 1987
- Electrooptical effects in siliconIEEE Journal of Quantum Electronics, 1987
- New measurement technique: cw electro-optic probing of electric fieldsApplied Physics Letters, 1986
- Noninvasive sheet charge density probe for integrated silicon devicesApplied Physics Letters, 1986
- Electrooptic sampling in GaAs integrated circuitsIEEE Journal of Quantum Electronics, 1986
- Silicon (Si)Published by Elsevier ,1985
- Electro-Absorption Effects at the Band Edges of Silicon and GermaniumPhysical Review B, 1966
- Quantum Theory of Free Carrier AbsorptionPhysical Review B, 1961
- Infrared Absorption in-Type SiliconPhysical Review B, 1957
- Determination of Optical Constants and Carrier Effective Mass of SemiconductorsPhysical Review B, 1957