Backbond Oxidation of the Si(001) Surface: Narrow Channel of Barrierless Oxidation
- 2 March 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 80 (9) , 2000-2003
- https://doi.org/10.1103/physrevlett.80.2000
Abstract
Oxidation of the Si(001) surface was studied by the first principles calculation technique with spin-polarized gradient approximation. We have clarified the apparent barrierless reaction mechanism of the backbond oxidation of the surface Si by incoming molecules. An molecule does not attack directly the backbond but the oxidation occurs via metastable chemisorption states on the Si surface. We have also found that the triplet-to-singlet spin conversion is crucial in explaining the incident energy dependence of the sticking probability of molecules.
Keywords
This publication has 17 references indexed in Scilit:
- Kinetics of Initial Layer-by-Layer Oxidation of Si(001) SurfacesPhysical Review Letters, 1998
- Atomic and electronic structures of oxygen-adsorbed Si(001) surfacesPhysical Review B, 1996
- The interaction of molecular and atomic oxygen with Si(100) and Si(111)Surface Science Reports, 1993
- STM studies of Si(100)-2×1 oxidation: defect chemistry and Si ejectionUltramicroscopy, 1992
- Energetics in the initial stage of oxidation of siliconPhysical Review B, 1991
- Molecular beam study on scattering and sticking of molecular oxygen at Si(100)Surface Science, 1991
- Soft self-consistent pseudopotentials in a generalized eigenvalue formalismPhysical Review B, 1990
- Kinetics of the adsorption of O2 and of the desorption of SiO on Si(100): A molecular beam, XPS, and ISS studySurface Science, 1987
- Chemisorption of Atomic Oxygen on Si(100): Self-Consistent Cluster and Slab Model InvestigationsPhysical Review Letters, 1984
- Interpretation of the spectra obtained from oxygen-adsorbed and oxidized silicon surfacesPhysical Review B, 1982